GL-GD-TC photoelectric detector characteristic test bench

Ⅰ、Product Introduction

The GL-GD-TC photoelectric detector characteristic test bench is mainly used to understand and study the characteristics and main technical issues of common photoelectric detectors. The bench consists of an experimental host (including seven-color light source drivers, power supplies and display instruments), a load module and an optical path component. The optical path components can be disassembled at will, and the optical path is clear at a glance, which is convenient for observation and measurement and enhances students' understanding of the system.

The instrument light source driver includes DC drive and pulse drive, and is equipped with a variety of adjustable DC voltage sources, which can be used as bias voltages for different photoelectric devices.

Ⅱ、Knowledge points

Photoresistor, photodiode, phototransistor, silicon photocell, photomultiplier tube, photoelectric detection, optical modulation and demodulation

Ⅲ、Involved courses

Optoelectronic technology, spectroscopy, photoelectric detection technology

Ⅳ、Experimental content of photoelectric detector characteristic test bench

1. Photoresistor basic characteristics experiment

2. Photodiode basic characteristics experiment

3. Phototransistor basic characteristics test experiment

4. Silicon photocell basic characteristics test experiment

5. APD photodiode basic characteristics test experiment

6. PIN photodiode basic characteristics test experiment

7. Color-sensitive photodiode basic characteristics test experiment

8. Photomultiplier tube basic characteristics test experiment

9. Optical modulation and demodulation experiment

Synchronous PC version:

GL-GD-TC photoelectric detector characteristic test bench   https://www.biisun.com/home/category/detail/id/167.html